Strengths and Limitations
This type of measurement comports some strenghts and limitations.
- Robust
- Fast
- Easy to use
- Completely integrable
- Analysis according to EN ISO 4287
Measurement Devices
MiniProfiler With or Without Camera for 2D Surface Analysis
- Measuring range: from ± 250 µm up to ± 1000 µm in z-direction
- Resolution: 20 Bit à with a measuring range of 1000 µm that results to ca. 1 nm (30 nm of noise underlying)
- Evaluation length: From 1,5 mm up to 70 mm different lengths are possible
- Rt, Rv, Ry, Ra, Rmr, Rp, Rq, Rz, Rmax, Rk, Rpk, Rvk
Lead Measurement System
- Analysis according to MBN 31007-7
- Parameters:
N -> Number of turns
α -> Lead angle
P -> pitch
S -> period length
D -> Average lead depth
Q -> Average feed cross section - Analysis of non-homogeneous surface structure or wobble error
If a solution or device is not listed above, please contact us. We will do our best to provide you with a solution that meets your requirements.